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Critical Technology

Advanced Packaging & Heterogeneous Integration

The capacity to assemble, package and integrate semiconductors at the frontier: advanced packaging, chiplet architectures and heterogeneous integration, where system performance is increasingly won. One of the capabilities of Semiconductors & Advanced Computing.

International families
86k2015 to 2024
Leading country
Japan1.6× the next
All families
160khome filings included
Over five years
Rising2020 to 2024 against the five before

Year by year

Patent families by country of origin and the year of the earliest filing, 2000 to 2025; 2025 is a part year, still filling in. International families are those for which protection was sought beyond one country.

Volume

International patent families in the capability, by the year of the earliest filing.

Source: Global Institute for National Capability (GINC), 2026. Underlying patents from 107 patent offices, IFI CLAIMS and Google

Share by country

Each country's share of the year's international families, in per cent: the capability's five largest countries of origin, 2015 to 2024, and the rest of the world.

Source: Global Institute for National Capability (GINC), 2026. Underlying patents from 107 patent offices, IFI CLAIMS and Google

Country leaderboard

International patent families, 2015 to 2024, by country of origin. Growth compares the latest five full years with the five before.

Ten largest

Japan

South Korea

United States

Taiwan

China

Germany

France

Singapore

Netherlands

Austria

24,716

15,416

12,420

11,991

9,796

4,692

1,343

993

899

674

2000 to 2025
1Japan24,71628.8%0.9×
37,559
2South Korea15,41617.9%1.7×
23,289
3United States12,42014.4%1.1×
20,810
4Taiwan11,99113.9%1.3×
16,245
5China9,79611.4%1.8×
47,642
6Germany4,6925.5%0.8×
6,134
7France1,3431.6%0.8×
1,557
8Singapore9931.2%2.2×
1,309
9Netherlands8991.0%1.3×
969
10Austria6740.8%1.1×
739
11Switzerland6160.7%1.8×
660
12United Kingdom3860.4%1.0×
481
13Canada2770.3%1.7×
368
14Italy2700.3%1.0×
370
15Belgium1780.2%1.0×
187
16Finland1760.2%1.3×
187
17Cayman Islands1660.2%0.2×
362
18Sweden1450.2%0.9×
157
19Israel1100.1%0.9×
152
20Ireland1100.1%1.1×
227
21Hong Kong520.1%1.2×
85
22Malaysia440.1%0.5×
83
23Türkiye390.0%1.6×
55
24Denmark340.0%2.8×
37
25Australia320.0%1.1×
39
26Spain310.0%0.8×
35
27Norway270.0%0.4×
28
28India240.0%2.4×
39
29Saudi Arabia170.0%0.1×
23
30Luxembourg140.0%0.4×
14
31Russia120.0%1.0×
128
32Poland110.0%0.8×
21
33Czechia70.0%0.8×
12
34Brazil60.0%0.0×
17
35Portugal40.0%0.3×
5
36New Zealand30.0%0.0×
3
37South Africa30.0%2.0×
3
38Mexico20.0%1.0×
10
39Hungary20.0%1.0×
2
40Liechtenstein10.0%0.0×
1

Applicants

The largest applicants by international patent families, 2015 to 2024: across the world, then within each of the five countries with the most families in Advanced Packaging & Heterogeneous Integration. Names are as held in the source and are not consolidated across subsidiaries.

Global

85,962 international families

SAMSUNG ELECTRONICS CO LTD · South Korea

TAIWAN SEMICONDUCTOR MFG CO LTD · Taiwan

SAMSUNG DISPLAY CO LTD · South Korea

INTEL CORP · United States

MITSUBISHI ELECTRIC CORP · Japan

TAIWAN SEMICONDUCTOR MFG · Taiwan

6,808

4,301

2,524

2,029

1,644

1,524

Japan

24,716 international families

MITSUBISHI ELECTRIC CORP

MURATA MANUFACTURING CO

ROHM CO LTD

FUJI ELECTRIC CO LTD

TOSHIBA KK

KIOXIA CORP

1,635

1,238

985

923

806

747

South Korea

15,416 international families

SAMSUNG ELECTRONICS CO LTD

SAMSUNG DISPLAY CO LTD

SK HYNIX INC

LG DISPLAY CO LTD

SAMSUNG ELECTRO MECH

LG ELECTRONICS INC

6,791

2,524

937

843

619

494

United States

12,420 international families

INTEL CORP

MICRON TECHNOLOGY INC

QUALCOMM INC

TEXAS INSTRUMENTS INC

APPLIED MATERIALS INC

SEMICONDUCTOR COMPONENTS IND LLC

1,999

865

695

552

523

391

Taiwan

11,991 international families

TAIWAN SEMICONDUCTOR MFG CO LTD

TAIWAN SEMICONDUCTOR MFG

NANYA TECHNOLOGY CORP

INNOLUX CORP

ADVANCED SEMICONDUCTOR ENG

SILICONWARE PRECISION INDUSTRIES CO LTD

4,289

1,520

580

579

562

496

China

9,796 international families

BOE TECHNOLOGY GROUP CO LTD

HUAWEI TECH CO LTD

CHANGXIN MEMORY TECH INC

YANGTZE MEMORY TECH CO LTD

CHENGDU BOE OPTOELECT TECH CO

SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECH CO LTD

1,246

855

560

377

175

167

Similar capabilities

The nine capabilities that share the most international patent families with Advanced Packaging & Heterogeneous Integration, 2015 to 2024: the families counted in both as a share of those counted in either. Each card shows its five largest countries.

Critical Technology

Advanced Semiconductor Fabrication

21.6% shared · 40,102 families in both

Japan

United States

South Korea

Taiwan

China

44,951

23,299

22,064

19,873

15,776

Strategic Infrastructure

Production Systems

9.3% shared · 37,777 families in both

Japan

United States

China

Germany

South Korea

106,439

60,107

40,792

37,205

32,878

Critical Technology

Semiconductor Equipment & Materials

6.9% shared · 11,734 families in both

Japan

United States

South Korea

China

Taiwan

37,853

15,529

13,584

8,665

6,232

Critical Technology

Compound & Power Semiconductors

3.6% shared · 3,648 families in both

Japan

Taiwan

United States

China

South Korea

7,085

3,005

2,833

2,353

1,705

Critical Technology

Advanced Imaging & Photonic Sensing

2.1% shared · 2,982 families in both

Japan

United States

China

South Korea

Germany

15,415

10,867

7,351

5,927

5,220

Production & Innovation

Foundational & Process Industries

1.8% shared · 7,003 families in both

Japan

United States

China

South Korea

Germany

94,317

55,479

36,011

28,513

26,005

Critical Technology

Advanced Optical Communication & Photonics

1.8% shared · 2,328 families in both

Japan

United States

China

Germany

South Korea

13,338

11,398

9,204

2,973

2,316

Critical Technology

Semiconductor Design & EDA

1.5% shared · 1,398 families in both

United States

Taiwan

China

South Korea

Japan

2,117

1,739

1,459

1,379

1,123

Production & Innovation

Manufacturing & Advanced Industry

1.0% shared · 5,751 families in both

Japan

United States

Germany

China

South Korea

138,612

87,628

76,621

49,292

40,578

Crosswalk

How Advanced Packaging & Heterogeneous Integration is matched to the patent classifications. The entries below were chosen for it; each stands for itself and everything beneath it in the scheme, 743 Cooperative entries in all. A patent family counts when any of its codes, in either scheme and at any office, falls under one of them. Codes since retired are placed under the entries that replaced them.

EntryTitle in the schemeWhy it is chosenCPC codesIPC codesDocuments
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h10Semiconductor packages, interposers, bonding, encapsulation and thermal control5,3881919,970,301
H10B80/00Assemblies of multiple devices comprising at least one memory device covered by this subclassStacked and assembled memory packages1113,891
H10D80/00Assemblies of multiple devices comprising at least one device covered by this subclassAssemblies of multiple semiconductor devices834,652
H10W10/00Isolation regions in semiconductor bodies between components of integrated devicesLeft out
H10W15/00Highly-doped buried regions of integrated devicesLeft out
H10W20/00Interconnections in chips, wafers or substratesLeft out

CPC and IPC codes are the codes in use on patent documents, at any office, that fall under the entry. Documents is the larger of the two schemes' counts of documents carrying one of them. An entry with no IPC codes can be told apart only in the Cooperative scheme.

The Cooperative codes in use that count towards Advanced Packaging & Heterogeneous Integration: 5,397 codes on 9,986,564 documents. The 150 most used are listed; the full list is in the cpc-to-capability.csv download.

CodeTitleUnder entryHow placedDocuments
H10W90/00Package configurationsH10WIn the scheme355,882
H10W90/724Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDLH10WIn the scheme189,483
H10W74/00Encapsulations, e.g. protective coatingsH10WIn the scheme186,068
H10W72/884Die-attach connectors and bond wiresH10WIn the scheme154,060
H10W90/734Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDLH10WIn the scheme144,891
H10W90/754Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDLH10WIn the scheme144,541
H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sinkH10WIn the scheme136,963
H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumpsH10WIn the scheme122,961
H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layersH10WIn the scheme115,705
H10W72/073Connecting or disconnecting of die-attach connectorsH10WIn the scheme111,963
H10W72/0198Manufacture or treatment batch processesH10WIn the scheme111,486
H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package partsH10WIn the scheme98,873
H10W70/65Shapes or dispositions of interconnectionsH10WIn the scheme96,955
H10W74/15Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfillsH10WIn the scheme93,621
H10W72/90Bond pads, in generalH10WIn the scheme88,872
H10W72/00Interconnections or connectors in packagesH10WIn the scheme86,925
H10W72/952Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or CuH10WIn the scheme82,020
H10W90/722Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chipsH10WIn the scheme78,907
H10W72/5522Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]H10WIn the scheme78,559
H10W72/252Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or CuH10WIn the scheme77,560
H10W72/075Connecting or disconnecting of bond wiresH10WIn the scheme76,502
H10W90/736Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked lead frame, conducting package substrate or heat sinkH10WIn the scheme75,285
H10W70/611Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips togetherH10WIn the scheme75,046
H10W72/072Connecting or disconnecting of bump connectorsH10WIn the scheme71,879
H10W70/635Through-viasH10WIn the scheme70,909
H10W70/685Shapes or dispositions thereof comprising multiple insulating layersH10WIn the scheme67,707
H10W72/5363Shapes of wire connectors the connected ends being wedge-shapedH10WIn the scheme67,243
H10W72/29Bond pads specially adapted thereforH10WIn the scheme64,224
H10W72/536Shapes of wire connectors the connected ends being ball-shapedH10WIn the scheme63,072
H10W72/30Die-attach connectorsH10WIn the scheme60,974
H10W72/241Dispositions, e.g. layoutsH10WIn the scheme59,153
H10W72/923Bond pads having multiple stacked layersH10WIn the scheme59,131
H10W74/01Manufacture or treatmentH10WIn the scheme57,397
H10W70/099Connecting interconnections to insulating or insulated package substrates, interposers or redistribution layersH10WIn the scheme56,213
H10W74/117Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations the substrate having spherical bumps for external connectionH10WIn the scheme56,013
H10W99/00Subject matter not provided for in other groups of this subclassH10WIn the scheme54,669
H10W72/50Bond wiresH10WIn the scheme53,198
H10W72/59Bond pads specially adapted thereforH10WIn the scheme52,607
H10W90/732Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chipsH10WIn the scheme51,798
H10W72/9415Dispositions of bond pads relative to the surface, e.g. recessed, protrudingH10WIn the scheme51,721
H10W70/05Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layersH10WIn the scheme50,984
H10W72/354Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics comprising polymersH10WIn the scheme50,841
H10W72/932Plan-view shape, i.e. in top viewH10WIn the scheme49,968
H10W74/111Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosedH10WIn the scheme49,508
H10W72/352Materials of die-attach connectors comprising metals or metalloids, e.g. soldersH10WIn the scheme47,752
H10W72/07236Soldering or alloyingH10WIn the scheme45,104
H10W40/22Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projectionsH10WIn the scheme44,729
H10W72/07251Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connectingH10WIn the scheme42,713
H10W72/012Manufacture or treatment of bump connectors, dummy bumps or thermal bumpsH10WIn the scheme42,452
H10W90/297Configurations of stacked chips characterised by the through-semiconductor vias [TSVs] in the stacked chipsH10WIn the scheme41,586
H10W74/114Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulationsH10WIn the scheme41,056
H10W70/614Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together the multiple chips being integrally enclosedH10WIn the scheme40,863
H10W46/00Marks applied to devices, e.g. for alignment or identificationH10WIn the scheme40,634
H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or dispositionH10WIn the scheme40,272
H10W72/019Manufacture or treatment of bond padsH10WIn the scheme40,259
H10W90/753Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between laterally-adjacent chipsH10WIn the scheme38,776
H10W74/014Manufacture or treatment using batch processingH10WIn the scheme37,742
H10W44/20Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF]H10WIn the scheme37,725
H10W72/5449Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangementsH10WIn the scheme37,114
H10W70/09Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers by depositing layers on the chip or wafer, e.g. "chip-first" RDLs extending onto an encapsulation that laterally surrounds the chip or wafer, e.g. fan-out wafer level package [FOWLP] RDLsH10WIn the scheme36,956
H10W90/401Package configurations characterised by multiple insulating or insulated package substrates, interposers or RDLsH10WIn the scheme36,784
H10W74/019Manufacture or treatment using temporary auxiliary substratesH10WIn the scheme36,566
H10W72/071Connecting or disconnectingH10WIn the scheme36,194
H10W72/9413Dispositions of bond pads on encapsulationsH10WIn the scheme36,169
H10W74/016Manufacture or treatment using mouldsH10WIn the scheme36,015
H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electronsH10WIn the scheme35,428
H10W72/5524Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]H10WIn the scheme35,119
H10W72/0711Apparatus thereforH10WIn the scheme34,730
H10W70/68Shapes or dispositions thereofH10WIn the scheme34,132
H10W72/877Bump connectors and die-attach connectorsH10WIn the scheme33,978
H10W42/121Arrangements for protection of devices protecting against mechanical damageH10WIn the scheme33,823
H10W72/5445Dispositions of bond wires being orthogonal to a side surface of the chip, e.g. parallel arrangementsH10WIn the scheme32,954
H10W40/255Arrangements for cooling characterised by their materials having a laminate or multilayered structure, e.g. direct bond copper [DBC] ceramic substratesH10WIn the scheme32,562
H10W72/325Die-attach connectors having a filler embedded in a matrixH10WIn the scheme32,020
H10W40/47Arrangements for thermal protection or thermal control involving heat exchange by flowing fluids by flowing liquids, e.g. forced water coolingH10WIn the scheme31,894
H10W72/07141Means for applying energy, e.g. ovens or lasersH10WIn the scheme31,194
H10W72/926Multiple bond pads having different sizesH10WIn the scheme30,968
H10W74/012Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfillsH10WIn the scheme30,691
H10W40/10Arrangements for heatingH10WIn the scheme30,532
H10W72/07554Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting changes in dispositionsH10WIn the scheme30,400
H10W72/874On different surfacesH10WIn the scheme29,537
H10W74/129Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed forming a chip-scale package [CSP]H10WIn the scheme29,253
H10W95/00Packaging processes not covered by the other groups of this subclassH10WIn the scheme28,518
H10W72/5525Materials of bond wires comprising metals or metalloids, e.g. silver comprising copper [Cu]H10WIn the scheme27,856
H10W72/07331Connecting techniquesH10WIn the scheme27,690
H10W70/095Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers of vias thereinH10WIn the scheme27,186
H10W70/682Shapes or dispositions thereof comprising holes having chips thereinH10WIn the scheme27,020
H10W74/142Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations exposing the passive side of the semiconductor bodyH10WIn the scheme26,783
H10W90/811Multiple chips on leadframesH10WIn the scheme26,431
H10W74/47Encapsulations, e.g. protective coatings characterised by their materials comprising organic materials, e.g. plastics or resinsH10WIn the scheme26,391
H10W72/942Dispositions of bond pads relative to underlying supporting features, e.g. bond pads, RDLs or viasH10WIn the scheme25,957
H10W72/251MaterialsH10WIn the scheme25,570
H10W72/244Dispositions, e.g. layouts relative to underlying supporting features, e.g. bond pads, RDLs or viasH10WIn the scheme25,360
H10W90/792Package configurations characterised by the relative positions of pads or connectors relative to package parts of direct-bonded pads between multiple chipsH10WIn the scheme24,920
H10W42/00Arrangements for protection of devicesH10WIn the scheme24,665
H10W72/547Dispositions of multiple bond wiresH10WIn the scheme23,831
H10W72/07336Soldering or alloyingH10WIn the scheme23,407
H10W72/552Materials of bond wires comprising metals or metalloids, e.g. silverH10WIn the scheme23,069
H10W72/944Dispositions of multiple bond padsH10WIn the scheme22,675
H10W40/73Fillings or auxiliary members in containers or in encapsulations for thermal protection or control for cooling by change of stateH10WIn the scheme22,603
H10W70/655Fan-out layoutsH10WIn the scheme22,387
H10W70/481Leadframes for devices being provided for in groups H10D8/00 - H10D48/00H10WIn the scheme22,028
H10W90/20Configurations of stacked chipsH10WIn the scheme21,480
H10W72/951Materials of bond padsH10WIn the scheme21,193
H01L25/0657Retired codeH10WRetired, by concordance20,905
H10W74/121Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by multiple encapsulations, e.g. by a thin protective coating and a thick encapsulationH10WIn the scheme20,433
H10W70/69Insulating materials thereofH10WIn the scheme20,395
H10W40/228Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections characterised by projecting parts, e.g. fins to increase surface area the projecting parts being wire-shaped or pin-shapedH10WIn the scheme20,285
H10W72/242Dispositions, e.g. layouts relative to the surface, e.g. recessed, protrudingH10WIn the scheme20,213
H01L2924/00Retired codeH10WRetired, by concordance20,139
H10W74/40Encapsulations, e.g. protective coatings characterised by their materialsH10WIn the scheme20,083
H10W70/421Shapes or dispositionsH10WIn the scheme19,768
H10W72/9445Top-view layouts, e.g. mirror arraysH10WIn the scheme19,403
H10W72/934Cross-sectional shape, i.e. in side viewH10WIn the scheme19,065
H10W40/226Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections characterised by projecting parts, e.g. fins to increase surface areaH10WIn the scheme18,792
H10W74/137Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations being directly on the semiconductor bodyH10WIn the scheme18,307
H10W46/301Marks applied to devices, e.g. for alignment or identification for alignmentH10WIn the scheme18,127
H10W70/692Ceramics or glassesH10WIn the scheme18,119
H10W76/60SealsH10WIn the scheme18,090
H10W70/63Vias, e.g. via plugsH10WIn the scheme17,749
H10W90/291Configurations of stacked chips characterised by containers, encapsulations, or other housings for the stacked chipsH10WIn the scheme17,621
H10W72/07254Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in dispositionsH10WIn the scheme17,594
H10W90/752Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between stacked chipsH10WIn the scheme17,499
H10W72/07533Ultrasonic bonding, e.g. thermosonic bondingH10WIn the scheme17,452
H01L25/0753Retired codeH10WRetired, by concordance17,242
H10W40/778Auxiliary members characterised by their shape in encapsulationsH10WIn the scheme17,183
H01L24/16Retired codeH10WRetired, by concordance17,138
H10W40/43Arrangements for thermal protection or thermal control involving heat exchange by flowing fluids by flowing gases, e.g. forced air coolingH10WIn the scheme16,778
H10W80/312Bonding techniques, e.g. hybrid bonding characterised by the direct bonding of electrically conductive padsH10WIn the scheme16,777
H10W80/327Bonding techniques, e.g. hybrid bonding characterised by the direct bonding of insulating parts, e.g. of silicon oxide layersH10WIn the scheme16,581
H10W70/688Flexible insulating substratesH10WIn the scheme16,509
H10W90/288Configurations of stacked chips characterised by arrangements for thermal management of the stacked chipsH10WIn the scheme16,387
H10W72/5473Dispositions of multiple bond wires multiple bond wires connected to a common bond padH10WIn the scheme16,373
H10W72/01515Forming coatingsH10WIn the scheme16,292
H01L25/50Retired codeH10WRetired, by concordance16,281
H10W40/258Metallic materialsH10WIn the scheme16,033
H10W90/22Configurations of stacked chips the stacked chips being on both top and bottom sides of a package substrate, interposer or RDLH10WIn the scheme15,841
H10W44/248Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF] for passive devices or passive elements for antennasH10WIn the scheme15,839
H10W72/07337Connecting techniques using a polymer adhesive, e.g. an adhesive based on silicone or epoxyH10WIn the scheme15,518
H10W72/01225Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition in solid form, e.g. by using a powder or by stud bumpingH10WIn the scheme15,423
H10W72/247Dispositions of multiple bumpsH10WIn the scheme15,350
H10W72/856Bump connectors and die-attach connectorsH10WIn the scheme15,227
H10W72/5475Dispositions of multiple bond wires multiple bond wires connected to common bond pads at both ends of the wiresH10WIn the scheme15,209
H10W90/24Configurations of stacked chips at least one of the stacked chips being laterally offset from a neighbouring stacked chip, e.g. chip stacks having a staircase shapeH10WIn the scheme15,194
H10W72/222Multilayered bumps, e.g. a coating on top and side surfaces of a bump coreH10WIn the scheme15,070
H10W72/013Manufacture or treatment of die-attach connectorsH10WIn the scheme14,929
H01L23/481Retired codeH10WRetired, by concordance14,856
H10W40/25Arrangements for cooling characterised by their materialsH10WIn the scheme14,739
H10W72/07354Connecting or disconnecting of die-attach connectors characterised by changes in properties of the die-attach connectors during connecting changes in dispositionsH10WIn the scheme14,729
H10W40/251OrganicsH10WIn the scheme14,600
Match: Direct
The capability is itself a technology or a kind of physical system, and the classification names it. Coverage is mainly CPC: the package entries H10W72 and H10W90 carry almost no IPC use, and the older H01L23 and H01L25 are absent from the scheme. The crosswalk is a first pass that nobody has reviewed.

Other capabilities in Semiconductors & Advanced Computing