- International families
- 86k2015 to 2024
- Leading country
- Japan1.6× the next
- All families
- 160khome filings included
- Over five years
- Rising2020 to 2024 against the five before
Year by year
Patent families by country of origin and the year of the earliest filing, 2000 to 2025; 2025 is a part year, still filling in. International families are those for which protection was sought beyond one country.
Volume
International patent families in the capability, by the year of the earliest filing.
Source: Global Institute for National Capability (GINC), 2026. Underlying patents from 107 patent offices, IFI CLAIMS and Google
Share by country
Each country's share of the year's international families, in per cent: the capability's five largest countries of origin, 2015 to 2024, and the rest of the world.
Source: Global Institute for National Capability (GINC), 2026. Underlying patents from 107 patent offices, IFI CLAIMS and Google
Country leaderboard
International patent families, 2015 to 2024, by country of origin. Growth compares the latest five full years with the five before.
Ten largest
Japan
South Korea
United States
Taiwan
China
Germany
France
Singapore
Netherlands
Austria
24,716
15,416
12,420
11,991
9,796
4,692
1,343
993
899
674
| 2000 to 2025 | ||||||
|---|---|---|---|---|---|---|
| 1 | Japan | 24,716 | 28.8% | 0.9× | 37,559 | |
| 2 | South Korea | 15,416 | 17.9% | 1.7× | 23,289 | |
| 3 | United States | 12,420 | 14.4% | 1.1× | 20,810 | |
| 4 | Taiwan | 11,991 | 13.9% | 1.3× | 16,245 | |
| 5 | China | 9,796 | 11.4% | 1.8× | 47,642 | |
| 6 | Germany | 4,692 | 5.5% | 0.8× | 6,134 | |
| 7 | France | 1,343 | 1.6% | 0.8× | 1,557 | |
| 8 | Singapore | 993 | 1.2% | 2.2× | 1,309 | |
| 9 | Netherlands | 899 | 1.0% | 1.3× | 969 | |
| 10 | Austria | 674 | 0.8% | 1.1× | 739 | |
| 11 | Switzerland | 616 | 0.7% | 1.8× | 660 | |
| 12 | United Kingdom | 386 | 0.4% | 1.0× | 481 | |
| 13 | Canada | 277 | 0.3% | 1.7× | 368 | |
| 14 | Italy | 270 | 0.3% | 1.0× | 370 | |
| 15 | Belgium | 178 | 0.2% | 1.0× | 187 | |
| 16 | Finland | 176 | 0.2% | 1.3× | 187 | |
| 17 | Cayman Islands | 166 | 0.2% | 0.2× | 362 | |
| 18 | Sweden | 145 | 0.2% | 0.9× | 157 | |
| 19 | Israel | 110 | 0.1% | 0.9× | 152 | |
| 20 | Ireland | 110 | 0.1% | 1.1× | 227 | |
| 21 | Hong Kong | 52 | 0.1% | 1.2× | 85 | |
| 22 | Malaysia | 44 | 0.1% | 0.5× | 83 | |
| 23 | Türkiye | 39 | 0.0% | 1.6× | 55 | |
| 24 | Denmark | 34 | 0.0% | 2.8× | 37 | |
| 25 | Australia | 32 | 0.0% | 1.1× | 39 | |
| 26 | Spain | 31 | 0.0% | 0.8× | 35 | |
| 27 | Norway | 27 | 0.0% | 0.4× | 28 | |
| 28 | India | 24 | 0.0% | 2.4× | 39 | |
| 29 | Saudi Arabia | 17 | 0.0% | 0.1× | 23 | |
| 30 | Luxembourg | 14 | 0.0% | 0.4× | 14 | |
| 31 | Russia | 12 | 0.0% | 1.0× | 128 | |
| 32 | Poland | 11 | 0.0% | 0.8× | 21 | |
| 33 | Czechia | 7 | 0.0% | 0.8× | 12 | |
| 34 | Brazil | 6 | 0.0% | 0.0× | 17 | |
| 35 | Portugal | 4 | 0.0% | 0.3× | 5 | |
| 36 | New Zealand | 3 | 0.0% | 0.0× | 3 | |
| 37 | South Africa | 3 | 0.0% | 2.0× | 3 | |
| 38 | Mexico | 2 | 0.0% | 1.0× | 10 | |
| 39 | Hungary | 2 | 0.0% | 1.0× | 2 | |
| 40 | Liechtenstein | 1 | 0.0% | 0.0× | 1 |
Applicants
The largest applicants by international patent families, 2015 to 2024: across the world, then within each of the five countries with the most families in Advanced Packaging & Heterogeneous Integration. Names are as held in the source and are not consolidated across subsidiaries.
Global
85,962 international families
SAMSUNG ELECTRONICS CO LTD · South Korea
TAIWAN SEMICONDUCTOR MFG CO LTD · Taiwan
SAMSUNG DISPLAY CO LTD · South Korea
INTEL CORP · United States
MITSUBISHI ELECTRIC CORP · Japan
TAIWAN SEMICONDUCTOR MFG · Taiwan
6,808
4,301
2,524
2,029
1,644
1,524
Japan
24,716 international families
MITSUBISHI ELECTRIC CORP
MURATA MANUFACTURING CO
ROHM CO LTD
FUJI ELECTRIC CO LTD
TOSHIBA KK
KIOXIA CORP
1,635
1,238
985
923
806
747
South Korea
15,416 international families
SAMSUNG ELECTRONICS CO LTD
SAMSUNG DISPLAY CO LTD
SK HYNIX INC
LG DISPLAY CO LTD
SAMSUNG ELECTRO MECH
LG ELECTRONICS INC
6,791
2,524
937
843
619
494
United States
12,420 international families
INTEL CORP
MICRON TECHNOLOGY INC
QUALCOMM INC
TEXAS INSTRUMENTS INC
APPLIED MATERIALS INC
SEMICONDUCTOR COMPONENTS IND LLC
1,999
865
695
552
523
391
Taiwan
11,991 international families
TAIWAN SEMICONDUCTOR MFG CO LTD
TAIWAN SEMICONDUCTOR MFG
NANYA TECHNOLOGY CORP
INNOLUX CORP
ADVANCED SEMICONDUCTOR ENG
SILICONWARE PRECISION INDUSTRIES CO LTD
4,289
1,520
580
579
562
496
China
9,796 international families
BOE TECHNOLOGY GROUP CO LTD
HUAWEI TECH CO LTD
CHANGXIN MEMORY TECH INC
YANGTZE MEMORY TECH CO LTD
CHENGDU BOE OPTOELECT TECH CO
SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECH CO LTD
1,246
855
560
377
175
167
Similar capabilities
The nine capabilities that share the most international patent families with Advanced Packaging & Heterogeneous Integration, 2015 to 2024: the families counted in both as a share of those counted in either. Each card shows its five largest countries.
Critical Technology
Advanced Semiconductor Fabrication
21.6% shared · 40,102 families in both
Japan
United States
South Korea
Taiwan
China
44,951
23,299
22,064
19,873
15,776
Strategic Infrastructure
Production Systems
9.3% shared · 37,777 families in both
Japan
United States
China
Germany
South Korea
106,439
60,107
40,792
37,205
32,878
Critical Technology
Semiconductor Equipment & Materials
6.9% shared · 11,734 families in both
Japan
United States
South Korea
China
Taiwan
37,853
15,529
13,584
8,665
6,232
Critical Technology
Compound & Power Semiconductors
3.6% shared · 3,648 families in both
Japan
Taiwan
United States
China
South Korea
7,085
3,005
2,833
2,353
1,705
Critical Technology
Advanced Imaging & Photonic Sensing
2.1% shared · 2,982 families in both
Japan
United States
China
South Korea
Germany
15,415
10,867
7,351
5,927
5,220
Production & Innovation
Foundational & Process Industries
1.8% shared · 7,003 families in both
Japan
United States
China
South Korea
Germany
94,317
55,479
36,011
28,513
26,005
Critical Technology
Advanced Optical Communication & Photonics
1.8% shared · 2,328 families in both
Japan
United States
China
Germany
South Korea
13,338
11,398
9,204
2,973
2,316
Critical Technology
Semiconductor Design & EDA
1.5% shared · 1,398 families in both
United States
Taiwan
China
South Korea
Japan
2,117
1,739
1,459
1,379
1,123
Production & Innovation
Manufacturing & Advanced Industry
1.0% shared · 5,751 families in both
Japan
United States
Germany
China
South Korea
138,612
87,628
76,621
49,292
40,578
Crosswalk
How Advanced Packaging & Heterogeneous Integration is matched to the patent classifications. The entries below were chosen for it; each stands for itself and everything beneath it in the scheme, 743 Cooperative entries in all. A patent family counts when any of its codes, in either scheme and at any office, falls under one of them. Codes since retired are placed under the entries that replaced them.
| Entry | Title in the scheme | Why it is chosen | CPC codes | IPC codes | Documents |
|---|---|---|---|---|---|
| H10W | Generic packages, interconnections, connectors or other constructional details of devices covered by class h10 | Semiconductor packages, interposers, bonding, encapsulation and thermal control | 5,388 | 191 | 9,970,301 |
| H10B80/00 | Assemblies of multiple devices comprising at least one memory device covered by this subclass | Stacked and assembled memory packages | 1 | 1 | 13,891 |
| H10D80/00 | Assemblies of multiple devices comprising at least one device covered by this subclass | Assemblies of multiple semiconductor devices | 8 | 3 | 4,652 |
| H10W10/00 | Isolation regions in semiconductor bodies between components of integrated devices | Left out | |||
| H10W15/00 | Highly-doped buried regions of integrated devices | Left out | |||
| H10W20/00 | Interconnections in chips, wafers or substrates | Left out |
CPC and IPC codes are the codes in use on patent documents, at any office, that fall under the entry. Documents is the larger of the two schemes' counts of documents carrying one of them. An entry with no IPC codes can be told apart only in the Cooperative scheme.
The Cooperative codes in use that count towards Advanced Packaging & Heterogeneous Integration: 5,397 codes on 9,986,564 documents. The 150 most used are listed; the full list is in the cpc-to-capability.csv download.
| Code | Title | Under entry | How placed | Documents |
|---|---|---|---|---|
| H10W90/00 | Package configurations | H10W | In the scheme | 355,882 |
| H10W90/724 | Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL | H10W | In the scheme | 189,483 |
| H10W74/00 | Encapsulations, e.g. protective coatings | H10W | In the scheme | 186,068 |
| H10W72/884 | Die-attach connectors and bond wires | H10W | In the scheme | 154,060 |
| H10W90/734 | Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL | H10W | In the scheme | 144,891 |
| H10W90/754 | Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL | H10W | In the scheme | 144,541 |
| H10W90/756 | Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink | H10W | In the scheme | 136,963 |
| H10W72/20 | Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps | H10W | In the scheme | 122,961 |
| H10W70/60 | Insulating or insulated package substrates; Interposers; Redistribution layers | H10W | In the scheme | 115,705 |
| H10W72/073 | Connecting or disconnecting of die-attach connectors | H10W | In the scheme | 111,963 |
| H10W72/0198 | Manufacture or treatment batch processes | H10W | In the scheme | 111,486 |
| H10W90/701 | Package configurations characterised by the relative positions of pads or connectors relative to package parts | H10W | In the scheme | 98,873 |
| H10W70/65 | Shapes or dispositions of interconnections | H10W | In the scheme | 96,955 |
| H10W74/15 | Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills | H10W | In the scheme | 93,621 |
| H10W72/90 | Bond pads, in general | H10W | In the scheme | 88,872 |
| H10W72/00 | Interconnections or connectors in packages | H10W | In the scheme | 86,925 |
| H10W72/952 | Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu | H10W | In the scheme | 82,020 |
| H10W90/722 | Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chips | H10W | In the scheme | 78,907 |
| H10W72/5522 | Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au] | H10W | In the scheme | 78,559 |
| H10W72/252 | Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu | H10W | In the scheme | 77,560 |
| H10W72/075 | Connecting or disconnecting of bond wires | H10W | In the scheme | 76,502 |
| H10W90/736 | Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked lead frame, conducting package substrate or heat sink | H10W | In the scheme | 75,285 |
| H10W70/611 | Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together | H10W | In the scheme | 75,046 |
| H10W72/072 | Connecting or disconnecting of bump connectors | H10W | In the scheme | 71,879 |
| H10W70/635 | Through-vias | H10W | In the scheme | 70,909 |
| H10W70/685 | Shapes or dispositions thereof comprising multiple insulating layers | H10W | In the scheme | 67,707 |
| H10W72/5363 | Shapes of wire connectors the connected ends being wedge-shaped | H10W | In the scheme | 67,243 |
| H10W72/29 | Bond pads specially adapted therefor | H10W | In the scheme | 64,224 |
| H10W72/536 | Shapes of wire connectors the connected ends being ball-shaped | H10W | In the scheme | 63,072 |
| H10W72/30 | Die-attach connectors | H10W | In the scheme | 60,974 |
| H10W72/241 | Dispositions, e.g. layouts | H10W | In the scheme | 59,153 |
| H10W72/923 | Bond pads having multiple stacked layers | H10W | In the scheme | 59,131 |
| H10W74/01 | Manufacture or treatment | H10W | In the scheme | 57,397 |
| H10W70/099 | Connecting interconnections to insulating or insulated package substrates, interposers or redistribution layers | H10W | In the scheme | 56,213 |
| H10W74/117 | Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations the substrate having spherical bumps for external connection | H10W | In the scheme | 56,013 |
| H10W99/00 | Subject matter not provided for in other groups of this subclass | H10W | In the scheme | 54,669 |
| H10W72/50 | Bond wires | H10W | In the scheme | 53,198 |
| H10W72/59 | Bond pads specially adapted therefor | H10W | In the scheme | 52,607 |
| H10W90/732 | Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips | H10W | In the scheme | 51,798 |
| H10W72/9415 | Dispositions of bond pads relative to the surface, e.g. recessed, protruding | H10W | In the scheme | 51,721 |
| H10W70/05 | Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers | H10W | In the scheme | 50,984 |
| H10W72/354 | Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics comprising polymers | H10W | In the scheme | 50,841 |
| H10W72/932 | Plan-view shape, i.e. in top view | H10W | In the scheme | 49,968 |
| H10W74/111 | Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed | H10W | In the scheme | 49,508 |
| H10W72/352 | Materials of die-attach connectors comprising metals or metalloids, e.g. solders | H10W | In the scheme | 47,752 |
| H10W72/07236 | Soldering or alloying | H10W | In the scheme | 45,104 |
| H10W40/22 | Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections | H10W | In the scheme | 44,729 |
| H10W72/07251 | Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting | H10W | In the scheme | 42,713 |
| H10W72/012 | Manufacture or treatment of bump connectors, dummy bumps or thermal bumps | H10W | In the scheme | 42,452 |
| H10W90/297 | Configurations of stacked chips characterised by the through-semiconductor vias [TSVs] in the stacked chips | H10W | In the scheme | 41,586 |
| H10W74/114 | Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by a substrate and the encapsulations | H10W | In the scheme | 41,056 |
| H10W70/614 | Insulating or insulated package substrates; Interposers; Redistribution layers for connecting multiple chips together the multiple chips being integrally enclosed | H10W | In the scheme | 40,863 |
| H10W46/00 | Marks applied to devices, e.g. for alignment or identification | H10W | In the scheme | 40,634 |
| H10W74/10 | Encapsulations, e.g. protective coatings characterised by their shape or disposition | H10W | In the scheme | 40,272 |
| H10W72/019 | Manufacture or treatment of bond pads | H10W | In the scheme | 40,259 |
| H10W90/753 | Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between laterally-adjacent chips | H10W | In the scheme | 38,776 |
| H10W74/014 | Manufacture or treatment using batch processing | H10W | In the scheme | 37,742 |
| H10W44/20 | Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF] | H10W | In the scheme | 37,725 |
| H10W72/5449 | Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangements | H10W | In the scheme | 37,114 |
| H10W70/09 | Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers by depositing layers on the chip or wafer, e.g. "chip-first" RDLs extending onto an encapsulation that laterally surrounds the chip or wafer, e.g. fan-out wafer level package [FOWLP] RDLs | H10W | In the scheme | 36,956 |
| H10W90/401 | Package configurations characterised by multiple insulating or insulated package substrates, interposers or RDLs | H10W | In the scheme | 36,784 |
| H10W74/019 | Manufacture or treatment using temporary auxiliary substrates | H10W | In the scheme | 36,566 |
| H10W72/071 | Connecting or disconnecting | H10W | In the scheme | 36,194 |
| H10W72/9413 | Dispositions of bond pads on encapsulations | H10W | In the scheme | 36,169 |
| H10W74/016 | Manufacture or treatment using moulds | H10W | In the scheme | 36,015 |
| H10W42/20 | Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons | H10W | In the scheme | 35,428 |
| H10W72/5524 | Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al] | H10W | In the scheme | 35,119 |
| H10W72/0711 | Apparatus therefor | H10W | In the scheme | 34,730 |
| H10W70/68 | Shapes or dispositions thereof | H10W | In the scheme | 34,132 |
| H10W72/877 | Bump connectors and die-attach connectors | H10W | In the scheme | 33,978 |
| H10W42/121 | Arrangements for protection of devices protecting against mechanical damage | H10W | In the scheme | 33,823 |
| H10W72/5445 | Dispositions of bond wires being orthogonal to a side surface of the chip, e.g. parallel arrangements | H10W | In the scheme | 32,954 |
| H10W40/255 | Arrangements for cooling characterised by their materials having a laminate or multilayered structure, e.g. direct bond copper [DBC] ceramic substrates | H10W | In the scheme | 32,562 |
| H10W72/325 | Die-attach connectors having a filler embedded in a matrix | H10W | In the scheme | 32,020 |
| H10W40/47 | Arrangements for thermal protection or thermal control involving heat exchange by flowing fluids by flowing liquids, e.g. forced water cooling | H10W | In the scheme | 31,894 |
| H10W72/07141 | Means for applying energy, e.g. ovens or lasers | H10W | In the scheme | 31,194 |
| H10W72/926 | Multiple bond pads having different sizes | H10W | In the scheme | 30,968 |
| H10W74/012 | Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills | H10W | In the scheme | 30,691 |
| H10W40/10 | Arrangements for heating | H10W | In the scheme | 30,532 |
| H10W72/07554 | Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting changes in dispositions | H10W | In the scheme | 30,400 |
| H10W72/874 | On different surfaces | H10W | In the scheme | 29,537 |
| H10W74/129 | Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed forming a chip-scale package [CSP] | H10W | In the scheme | 29,253 |
| H10W95/00 | Packaging processes not covered by the other groups of this subclass | H10W | In the scheme | 28,518 |
| H10W72/5525 | Materials of bond wires comprising metals or metalloids, e.g. silver comprising copper [Cu] | H10W | In the scheme | 27,856 |
| H10W72/07331 | Connecting techniques | H10W | In the scheme | 27,690 |
| H10W70/095 | Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers of vias therein | H10W | In the scheme | 27,186 |
| H10W70/682 | Shapes or dispositions thereof comprising holes having chips therein | H10W | In the scheme | 27,020 |
| H10W74/142 | Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations exposing the passive side of the semiconductor body | H10W | In the scheme | 26,783 |
| H10W90/811 | Multiple chips on leadframes | H10W | In the scheme | 26,431 |
| H10W74/47 | Encapsulations, e.g. protective coatings characterised by their materials comprising organic materials, e.g. plastics or resins | H10W | In the scheme | 26,391 |
| H10W72/942 | Dispositions of bond pads relative to underlying supporting features, e.g. bond pads, RDLs or vias | H10W | In the scheme | 25,957 |
| H10W72/251 | Materials | H10W | In the scheme | 25,570 |
| H10W72/244 | Dispositions, e.g. layouts relative to underlying supporting features, e.g. bond pads, RDLs or vias | H10W | In the scheme | 25,360 |
| H10W90/792 | Package configurations characterised by the relative positions of pads or connectors relative to package parts of direct-bonded pads between multiple chips | H10W | In the scheme | 24,920 |
| H10W42/00 | Arrangements for protection of devices | H10W | In the scheme | 24,665 |
| H10W72/547 | Dispositions of multiple bond wires | H10W | In the scheme | 23,831 |
| H10W72/07336 | Soldering or alloying | H10W | In the scheme | 23,407 |
| H10W72/552 | Materials of bond wires comprising metals or metalloids, e.g. silver | H10W | In the scheme | 23,069 |
| H10W72/944 | Dispositions of multiple bond pads | H10W | In the scheme | 22,675 |
| H10W40/73 | Fillings or auxiliary members in containers or in encapsulations for thermal protection or control for cooling by change of state | H10W | In the scheme | 22,603 |
| H10W70/655 | Fan-out layouts | H10W | In the scheme | 22,387 |
| H10W70/481 | Leadframes for devices being provided for in groups H10D8/00 - H10D48/00 | H10W | In the scheme | 22,028 |
| H10W90/20 | Configurations of stacked chips | H10W | In the scheme | 21,480 |
| H10W72/951 | Materials of bond pads | H10W | In the scheme | 21,193 |
| H01L25/0657 | Retired code | H10W | Retired, by concordance | 20,905 |
| H10W74/121 | Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed by multiple encapsulations, e.g. by a thin protective coating and a thick encapsulation | H10W | In the scheme | 20,433 |
| H10W70/69 | Insulating materials thereof | H10W | In the scheme | 20,395 |
| H10W40/228 | Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections characterised by projecting parts, e.g. fins to increase surface area the projecting parts being wire-shaped or pin-shaped | H10W | In the scheme | 20,285 |
| H10W72/242 | Dispositions, e.g. layouts relative to the surface, e.g. recessed, protruding | H10W | In the scheme | 20,213 |
| H01L2924/00 | Retired code | H10W | Retired, by concordance | 20,139 |
| H10W74/40 | Encapsulations, e.g. protective coatings characterised by their materials | H10W | In the scheme | 20,083 |
| H10W70/421 | Shapes or dispositions | H10W | In the scheme | 19,768 |
| H10W72/9445 | Top-view layouts, e.g. mirror arrays | H10W | In the scheme | 19,403 |
| H10W72/934 | Cross-sectional shape, i.e. in side view | H10W | In the scheme | 19,065 |
| H10W40/226 | Arrangements for cooling characterised by their shape, e.g. having conical or cylindrical projections characterised by projecting parts, e.g. fins to increase surface area | H10W | In the scheme | 18,792 |
| H10W74/137 | Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being only partially enclosed the encapsulations being directly on the semiconductor body | H10W | In the scheme | 18,307 |
| H10W46/301 | Marks applied to devices, e.g. for alignment or identification for alignment | H10W | In the scheme | 18,127 |
| H10W70/692 | Ceramics or glasses | H10W | In the scheme | 18,119 |
| H10W76/60 | Seals | H10W | In the scheme | 18,090 |
| H10W70/63 | Vias, e.g. via plugs | H10W | In the scheme | 17,749 |
| H10W90/291 | Configurations of stacked chips characterised by containers, encapsulations, or other housings for the stacked chips | H10W | In the scheme | 17,621 |
| H10W72/07254 | Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in dispositions | H10W | In the scheme | 17,594 |
| H10W90/752 | Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between stacked chips | H10W | In the scheme | 17,499 |
| H10W72/07533 | Ultrasonic bonding, e.g. thermosonic bonding | H10W | In the scheme | 17,452 |
| H01L25/0753 | Retired code | H10W | Retired, by concordance | 17,242 |
| H10W40/778 | Auxiliary members characterised by their shape in encapsulations | H10W | In the scheme | 17,183 |
| H01L24/16 | Retired code | H10W | Retired, by concordance | 17,138 |
| H10W40/43 | Arrangements for thermal protection or thermal control involving heat exchange by flowing fluids by flowing gases, e.g. forced air cooling | H10W | In the scheme | 16,778 |
| H10W80/312 | Bonding techniques, e.g. hybrid bonding characterised by the direct bonding of electrically conductive pads | H10W | In the scheme | 16,777 |
| H10W80/327 | Bonding techniques, e.g. hybrid bonding characterised by the direct bonding of insulating parts, e.g. of silicon oxide layers | H10W | In the scheme | 16,581 |
| H10W70/688 | Flexible insulating substrates | H10W | In the scheme | 16,509 |
| H10W90/288 | Configurations of stacked chips characterised by arrangements for thermal management of the stacked chips | H10W | In the scheme | 16,387 |
| H10W72/5473 | Dispositions of multiple bond wires multiple bond wires connected to a common bond pad | H10W | In the scheme | 16,373 |
| H10W72/01515 | Forming coatings | H10W | In the scheme | 16,292 |
| H01L25/50 | Retired code | H10W | Retired, by concordance | 16,281 |
| H10W40/258 | Metallic materials | H10W | In the scheme | 16,033 |
| H10W90/22 | Configurations of stacked chips the stacked chips being on both top and bottom sides of a package substrate, interposer or RDL | H10W | In the scheme | 15,841 |
| H10W44/248 | Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF] for passive devices or passive elements for antennas | H10W | In the scheme | 15,839 |
| H10W72/07337 | Connecting techniques using a polymer adhesive, e.g. an adhesive based on silicone or epoxy | H10W | In the scheme | 15,518 |
| H10W72/01225 | Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition in solid form, e.g. by using a powder or by stud bumping | H10W | In the scheme | 15,423 |
| H10W72/247 | Dispositions of multiple bumps | H10W | In the scheme | 15,350 |
| H10W72/856 | Bump connectors and die-attach connectors | H10W | In the scheme | 15,227 |
| H10W72/5475 | Dispositions of multiple bond wires multiple bond wires connected to common bond pads at both ends of the wires | H10W | In the scheme | 15,209 |
| H10W90/24 | Configurations of stacked chips at least one of the stacked chips being laterally offset from a neighbouring stacked chip, e.g. chip stacks having a staircase shape | H10W | In the scheme | 15,194 |
| H10W72/222 | Multilayered bumps, e.g. a coating on top and side surfaces of a bump core | H10W | In the scheme | 15,070 |
| H10W72/013 | Manufacture or treatment of die-attach connectors | H10W | In the scheme | 14,929 |
| H01L23/481 | Retired code | H10W | Retired, by concordance | 14,856 |
| H10W40/25 | Arrangements for cooling characterised by their materials | H10W | In the scheme | 14,739 |
| H10W72/07354 | Connecting or disconnecting of die-attach connectors characterised by changes in properties of the die-attach connectors during connecting changes in dispositions | H10W | In the scheme | 14,729 |
| H10W40/251 | Organics | H10W | In the scheme | 14,600 |